ISO 12085:1996 download free

07-14-2021 comment

ISO 12085:1996 download free.Geometrical Product Specification ( GPS ) Surface texture : Profile method – Motif parameters.
ISO 12085 is a Geometrical Product Specification (GPS) standard and is to be regarded as a General GPS standard (see ISO/TR 14638). It influences links 2. 3 and 4 of the surface texture chain of standards on roughness profile and waviness profile.
For more detailed information of the relation of ISO 12085 to other GPS standards, see annex C.
The approach described in ISO 12085 facilitates the determining roughness and waviness parameters from the primary profile by finding those motifs which characterize the surface under consideration. This method is independent of any profile filter and results in parameters which are based on the depth and spacing of the motifs. These parameters. which are complementary to those defined in ISO 4287, can be used to describe the functional properties of workpieces as indicated in Annex B.
ISO 12085 defines terms and parameters used for determining surface texture by the motif method. It also describes the corresponding ideal operator and measuring conditions.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of ISO 12085. At the time of publication, the editions indicated were valid. All standards are subject to revision, and parties to agreements based on ISO 12085 are encouraged to investigate the possibility of applying the most recent editions of the standards indicated below. Members of IEC and ISO maintain registers of currently valid International Standards.
ISO 1302:1992. Technical drawings — Method of indicating surface texture.
ISO 3274:1996. Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of contact (stylus) instruments.
ISO 4287:1996, Geometrical Product Specifications (GPS) — Surface texture Profile method — Terms, definitions and parameters of surface texture.
ISO 4288:1996, Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the assessment of surface texture.
3 Definitions
For the purposes of ISO 12085 the following definitions apply.
3.1 General definitions
3.1.1 surface profile: (See ISO 4287.)
3.1.2 primary profile: (See ISO 3274.)
3.1.7 upper envelope line of the primary profile (waviness profile): Straight lines oning the highest points of peaks of the primary profile, after conventional discrimination of peaks (see figure 4).
3.1.8 waviness motif: Motif derived on the upper envelope line by using the ideal operator with limit value B (see figure 5).
UDDer envelope line
Figure 4 — Upper envelope line
3.2 Parameter definitions
3.2.1 mean spacing of roughness motifs, AR: The anthmetical mean value of the lengths AR, of roughness motifs. within the evaluation length (see figure 6). i.e.
AR=—i-)J, AR1
E1
where n is the number of roughness motifs (equal to the number of AR, values).
3.2.2 mean depth of roughness motifs, R: The arithmetical mean value of the depths H, of roughness motifs. within the evaluation length (see figure 6), i.e.
j.i
where m is the number of Ii values,
NOTE 2 The number of H1 values is twice the number of AR, values (m = 2n).
3.2.3 maximum depth of profile irregularity, Rr The largest depth. H. within the evaluation length.
4 Theoretically exact operator of the motif method
4.1 General
This clause describes the identification Conditions of motifs (length and depth discrimination) and presents the process for calculating roughness and waviness parameters.
4.2 Conventional limits of motifs
The recommended values for limits A and 8 as described in figure 8 are given under clause 5.
4.3 Depth discrimination
The depth discrimination applies to the primary profile for the assessment of surface roughness.
4.3.1 Discrimination based on minimum depth
Divide the primary profile into sections of width A/2, and take the height of each rectangle.
The local peaks taken into account are those whose depth is larger than 5 % of the mean height of these rectangles (see figure 9).

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